SCOPUS 정보 검색 플랫폼

Volumn 36, Issue 6, 1989, Pages 2247-2251

Radiation characterization of a 28C256 EEPROM

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--FIXED; SEMICONDUCTING SILICON;

BREMSSTRAHLUNG; LATCHUP THRESHOLDS;

INTEGRATED CIRCUITS;

EID: 0024908420 PISSN: 00189499 EISSN: 15581578 Source Type: Journal
DOI: 10.1109/23.45431 Document Type: Article

Times cited : (19)

References (4)

1
- 6044220553
- P.S. Winokur, F.W. Sexton, J.R. Schwank, D.M. Fleetwood, P.V. Dressendorfer, and T.F. Wrobel, IEEE Trans. Nucl. Sci. NS-33, 1343 (1986).
- (1986) IEEE Trans. Nucl. Sci , vol.NS-33 , pp. 1343
- Winokur, P.S.¹ Sexton, F.W.² Schwank, J.R.³ Fleetwood, D.M.⁴ Dressendorfer, P.V.⁵ Wrobel, T.F.⁶

2
- 84939032057
- D. Schiff, IEEE Trans. Nucl. Sci., NS-34, 1742, (1987).
- (1987) Trans IEEE Nucl. Sci , vol.NS-34 , pp. 1742
- Schiff, D.¹

3
- 3743153188
- P.S. Winokur, F.W. Sexton, G.L. Hash, and D.C. Turpin, IEEE Trans. Nucl. Sci., NS-34, 1448, (1988).
- (1988) IEEE Trans. Nucl. Sci , vol.NS-34 , pp. 1448
- Winokur, P.S.¹ Sexton, F.W.² Hash, G.L.³ Turpin, D.C.⁴

4
- 0004005306
- John Wiley and Sons, New York
- S. M. Sze, The Physics of Semiconductor Devices, John Wiley and Sons, New York, 1981.
- (1981) The Physics of Semiconductor Devices
- Sze, S.M.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.