Application of a Model for Treatment of Time Dependent Effects on Irradiation of Microelectronic Devices

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 1954-1962

  Brown, Dennis B ^a   Jenkins, William C ^a   Johnston, Allan H ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICES;

HARDNESS ASSURANCE TESTING; HOLE ANNEALING TIMES;

MICROELECTRONICS;

EID: 0024908415     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45392     Document Type: Article

References (18)

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