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Volumn 36, Issue 12, 1989, Pages 2889-2894

The Emitter-Base Interface Current in Silicon Bipolar Transistors with Emitters Deposited by Plasma-Enhanced CVD

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS--EPITAXIAL GROWTH; GLOW DISCHARGES; PLASMA DEVICES; SEMICONDUCTING SILICON;

EID: 0024906771     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.40951     Document Type: Article
Times cited : (18)

References (12)
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    • M. Grundner and H. Jacob, “Investigations on hydrophilic and hydrophobic silicon (100) wafer surfaces by X-ray photoelectron and high-resolution electron energy loss-spectroscopy,” Appl. Phys. A. vol. 39, pp. 73–82, 1986.
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    • Dec.
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  • 7
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    • Amorphous and microcrystalline crocrystalline silicon bipolar heterojunction transistors
    • J. Symons, K. Baert, J. Nijs, and R. Mertens, “Amorphous and microcrystalline crocrystalline silicon bipolar heterojunction transistors,” J. Non-Cryst. Cryst. Solids, vol. 98, pp. 1315–1318, 1987.
    • (1987) J. Non-Cryst. Cryst. Solids , vol.98 , pp. 1315-1318
    • Symons, J.1    Baert, K.2    Nijs, J.3    Mertens, R.4
  • 8
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    • S. Suzuki and T. Itoh, “Effect of Si-Ge buffer layer for low-temperature Si epitaxial growth on Si substrate by rf plasma chemical vapor deposition,” J. Appl. Phys., vol. 54. no. 3, pp. 1466–1470, 1983.
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  • 10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.