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Volumn , Issue , 1989, Pages 28-37
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Theoretical comparison of testing methods
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Author keywords
[No Author keywords available]
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Indexed keywords
PROBABILITY--RANDOM PROCESSES;
RELIABILITY;
DEFECT RATE;
FAILURE RATE;
RANDOM TESTING;
COMPUTER SOFTWARE;
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EID: 0024891967
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/75309.75313 Document Type: Conference Paper |
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Times cited : (50)
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References (31)
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