An improved standard total dose test for CMOS space electronics

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 1963-1970

  Fleetwood, D M ^a   Winokur, P S ^a   Riewe, L C ^a   Pease, R L ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b MISSION RESEARCH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; GAMMA RAYS; HEAT TREATMENT--ANNEALING; TRANSISTORS, BIPOLAR--SPACE APPLICATIONS;

CMOS TECHNOLOGY; POSTIRRADIATION RESPONSE;

SEMICONDUCTOR DEVICES, MOS;

EID: 0024891801     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45393     Document Type: Article

References (22)

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