Orientation Dependence of Interface-trap Transformation

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 1784-1791

  Wang, Yu ^a   Ma, T P ^a   Barker, R C ^a  

^a YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRONS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES--SEMICONDUCTOR INSULATOR BOUNDARIES; SILICA;

INTERFACE TRAPS; ORIENTATION DEPENDENCE;

SEMICONDUCTOR DEVICES, MOS;

EID: 0024891798     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45370     Document Type: Article

References (13)

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