SPECS simulation validation with efficient transient sensitivity computation

Volumn , Issue , 1989, Pages 252-255

  Nguyen, Tuyen V ^a   Feldmann, Peter ^a   Director, Stephen W ^a   Rohrer, Ronald A ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS--TRANSIENTS;

SIMULATION VALIDATION; SPECS (SIMULATION PROGRAM FOR ELECTRONIC CIRCUITS AND SYSTEMS); SUPPRESSED PARASITICS; TRANSIENT SENSITIVITIES;

ELECTRONIC CIRCUITS;

EID: 0024888673     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)