Complexity analysis of sequential ATPG

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 3, Issue , 1989, Pages 1946-1949

  Lioy, A ^a   Montessoro, P L ^a   Gai, S ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING--COMPUTER AIDED ANALYSIS; INTEGRATED CIRCUIT TESTING--COMPUTER AIDED ANALYSIS; LOGIC CIRCUITS--TESTING;

AUTOMATIC TEST PATTERN GENERATION; BENCHMARKS; COMPUTER AIDED TESTING; SEQUENTIAL CIRCUITS; TEST COMPLEXITY ANALYSIS; TOPOLOGICAL ANALYSIS;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0024887650     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)