Proton induced upsets in the low altitude polar orbit

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 2339-2343

  Adams, Leonard ^a   Harboe Sorensen, Reno ^a   Daly, Eamon ^a   Ward, Jeff ^b  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; PROTONS; SATELLITES; SEMICONDUCTOR DEVICES, MOS;

POLAR REGIONS; SINGLE EVENT UPSETS; STATIC CMOS MEMORIES; UOSAT-2 SATELLITE;

INTEGRATED CIRCUITS;

EID: 0024887313     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45445     Document Type: Article

References (8)

1. W.L. Bendel & E.L. Peterson. “Proton Upsets in Orbit”. IEEE Trans. Nucl. Sci. NS30(6), Dec. 1983.
2. E. Peterson. “Soft Errors due to Protons in the Radiation Belt”. IEEE Tans. Nucl. Sci. NS28, (6), Dec. 1981.
3. J.W. Ward. “UOSAT-2 Single Event Upset Monitoring”. Progress Report 1 on ESTEC Contract 7396/87/NL/IW. Nov. 1988.
4. D. Sawyer & J. Vette. “AP8 Trapped Proton Environment for Solar Maximum and Solar Minimum”. NSSDC/WDC-A-R&S 76–06, 1976.
5. See Ref (1).
6. D.K. Nichols. “Single Event Upset of Semiconductor Devices”. A Summary of JPL Test Data. JPL Report D-38. June 1982.
7. J.H. Adams. “Cosmic Ray Effects on Microelectronics, Part 4”. NRL Memorandum Report 5901. Dec 1986.
8. M.S. Gussenhoven at al. “New Low Altitude Dose Measurements”. IEEE Trans. Nucl. Sci. NS34 (3). June 1987.