Layout-driven test generation

Volumn , Issue , 1989, Pages 154-157

  Nigh, Phil ^a   Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING;

ABSTRACT FAULT MODELS; DESIGN-RULE CHECKING; LAYOUT-DRIVEN GENERATION; STUCK-FAULT MODEL; TEST GENERATION; TEST VECTORS;

INTEGRATED CIRCUITS;

EID: 0024882140     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)