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Volumn , Issue , 1989, Pages 307-314
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New approach of test confidence estimation
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUIT TESTING;
CONFIDENCE MEASURES;
FAULTY CIRCUIT COVERAGE;
RANDOM TESTING;
LOGIC CIRCUITS;
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EID: 0024873085
PISSN: 07313071
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (12)
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References (18)
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