HAST applications: acceleration factors and results for VLSI components

Volumn , Issue , 1989, Pages 114-121

  Danielson, D ^a   Marcyk, G ^a   Babb, E ^a   Kudva, S ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; DATA STORAGE, SEMICONDUCTOR--STORAGE DEVICES; FAILURE ANALYSIS;

ACCELERATION FACTORS; CMOS RAMS; HIGHLY ACCELERATED STRESS TESTS; NMOS EPROMS; RELATIVE HUMIDITY TESTS;

INTEGRATED CIRCUITS, VLSI;

EID: 0024867548     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1989.363372     Document Type: Conference Paper

References (8)