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Volumn , Issue , 1989, Pages 220-228
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Characterization of electromigration under bidirectional (BC) and pulsed unidirectional (PDC) currents
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM SILICON ALLOYS--THIN FILMS;
AC STRESSES;
DC STRESSES;
ELECTROMIGRATION;
INTEGRATED CIRCUITS;
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EID: 0024865572
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/irps.1989.363390 Document Type: Conference Paper |
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Times cited : (67)
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References (22)
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