Internal ESD transients in input protection circuits

Volumn , Issue , 1989, Pages 77-81

  Fong, Y ^a   Hu, C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; SEMICONDUCTOR DEVICES, MOS--RELIABILITY; STRESSES; TRANSISTORS;

GROUNDED GATE TRANSISTORS; INPUT PROTECTION CIRCUITS; THICK FIELD DEVICES;

INTEGRATED CIRCUITS;

EID: 0024864320     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1989.363365     Document Type: Conference Paper

References (8)