ESD phenomena in graded junction devices

Volumn , Issue , 1989, Pages 71-76

  Duvvury, C ^a   Rountree, R N ^a   Stiegler, H J ^a   Polgreen, T ^a   Corum, D ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC DISCHARGES; FAILURE ANALYSIS; INTEGRATED CIRCUITS, VLSI--RELIABILITY; TEMPERATURE DISTRIBUTION--TRANSIENTS;

CIRCUIT DRIVE CURRENT; CMOS INTEGRATED CIRCUITS; GRADED JUNCTION DEVICES; HOT CARRIER RELIABILITY; TRANSIENT THERMAL ANALYSIS;

SEMICONDUCTOR DEVICES, MOS;

EID: 0024861842     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1989.363364     Document Type: Conference Paper

References (12)