Electromigration damage response time and implications for DC and pulsed characterizations

Volumn , Issue , 1989, Pages 229-233

  Suehle, John S ^a   Schafft, Harry A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING;

AC STRESSES; DC STRESSES; ELECTROMIGRATION DAMAGE RESPONSE TIME;

INTEGRATED CIRCUITS;

EID: 0024860581     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1989.363391     Document Type: Conference Paper

References (18)