A Cross Section of α-Particle-Induced Soft-Error Phenomena in VLSI's

IEEE Transactions on Electron Devices

Volumn 36, Issue 11, 1989, Pages 2567-2575

  Takeda, Eiji ^a   Takeuchi, Kan ^a   Hisamoto, Digh ^a   Toyabe, Toru ^a   Itoh, Kiyoo ^a   Ohshima, Kazuyoshi ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS--RADIATION EFFECTS; SEMICONDUCTOR DEVICES--RADIATION EFFECTS;

ALPHA PARTICLE; FUNNELING LENGTH; SOFT-ERROR PHENOMENA; SUBMICROMETER VLSI DESIGN; VLSI IRRADIATION;

INTEGRATED CIRCUITS, VLSI;

EID: 0024765647     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.43681     Document Type: Article

References (15)

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