Line-Drawing Interpretation: Bilateral Symmetry

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 11, Issue 10, 1989, Pages 1117-1120

  Nalwa, Vishvjit S ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BILATERAL SYMMETRY; IMAGE LINE PATTERN ANALYSIS; LINE DRAWINGS; SURFACE OF REVOLUTION;

IMAGE PROCESSING;

EID: 0024755204     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.42842     Document Type: Article

References (15)

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