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Volumn 28, Issue 10 A, 1989, Pages L1734-L1736

Modulation of drain current by holes generated by impact ionization in gaas mesfet

Author keywords

Buried p layer; Gaas MESFET; Impact ionization; Kink effect; Sidegating effect

Indexed keywords

MAGNESIUM AND ALLOYS; SEMICONDUCTING GALLIUM ARSENIDE--IONIZATION;

EID: 0024751539     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.28.L1734     Document Type: Article
Times cited : (8)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.