Bias Dependence of the MODFET Intrinsic Model Elements Values at Microwave Frequencies

IEEE Transactions on Electron Devices

Volumn 36, Issue 10, 1989, Pages 2267-2273

  Hughes, Brian ^a   Tasker, Paul J ^b  

^a Hewlett Packard Microwave Instruments Division   (United States)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; MICROWAVES;

FIGURE OF MERIT PLOTS; MODFETS;

TRANSISTORS, FIELD EFFECT;

EID: 0024751374     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.40909     Document Type: Article

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