Convergent beam diffraction studies of interfaces, defects, and multilayers

Journal of Electron Microscopy Technique

Volumn 13, Issue 2, 1989, Pages 111-122

  Cherns, D ^a   Preston, A R ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

Bicrystals; Crystal defects; Large angle convergent beam electron diffraction; Layer strains

Indexed keywords

ARTICLE; CRYSTALLOGRAPHY; ELECTRON MICROSCOPY; METHODOLOGY; PHYSICAL CHEMISTRY;

CHEMISTRY, PHYSICAL; CRYSTALLOGRAPHY; MICROSCOPY, ELECTRON;

EID: 0024743222     PISSN: 07410581     EISSN: 15530817     Source Type: Journal    
DOI: 10.1002/jemt.1060130204     Document Type: Article

References (24)

1. Size and sign of the Burgers vector from transmission micrographs
2. Threedimensional strainfield information in convergent beam electron diffraction patterns
3. Convergent beam electron diffraction from AlGaAs/GaAs single quantum wells
4. Electron diffraction studies of strain in epitaxial bicrystals and multilayers
5. Convergent beam diffraction studies of crystal defects
6. The principles and practice of the weak beam method of electron microscopy
7. Convergent beam electron diffraction study of transverse stacking faults and dislocations
8. 3
9. A kinematical theory of electron transmission microscope images of dislocations and other defects
10. The use of convergent beam electron diffraction to determine local lattice distortions in nickelbase superalloys
11. The determination of foil thickness by scanning transmission electron microscopy
12. Lattice parameter measurement by convergent beam electron diffraction
13. Convergent beam electron diffraction and imaging of strainedlayer superlattices
14. Measurement of strain in convergent beam electron diffraction patterns
15. Application of convergent beam electron diffraction to the determination of grain boundary structures
16. CBED studies of imperfect crystals
17. Large angle convergent beam electron diffraction
18. Structure of AlGaAs/GaAs multilayers imaged in superlattice reflections
19. Measurement of strain in silver halide particles by convergent beam electron diffraction
20. Diffraction and imaging from semiconductor multilayers