High resolution imaging of magnetic structures in the transmission electron microscope

Materials Science and Engineering B

Volumn 3, Issue 4, 1989, Pages 355-358

  Chapman, J N ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS--MICROSTRUCTURE; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION--SCANNING ELECTRON MICROSCOPY;

HIGH RESOLUTION IMAGING; LORENTZ MICROSCOPY; MAGNETIC INDUCTION DISTRIBUTION;

MAGNETIC MATERIALS;

EID: 0024739216     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(89)90140-2     Document Type: Article

References (19)

1. Significance of Electromagnetic Potentials in the Quantum Theory
2. The Electron Interference Method for Magnetization Measurement of Thin Films
3. Investigation of Cr segregation within rf-sputtered CoCr films