Transverse Susceptibility of a Fine Particle System

IEEE Transactions on Magnetics

Volumn 25, Issue 5, 1989, Pages 4216-4218

  Chantrell, R W ^a   Hoare, A ^a   Melville, D ^a   Lutke Stetzkamp, H J ^b   Methfessel, S ^b  

^a UNIVERSITY OF CENTRAL LANCASHIRE   (United Kingdom)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS; MAGNETIC MEASUREMENTS;

FINE PARTICLE; LONGITUDINAL PARTICULATE; NONLINEAR SUSCEPTIBILITY; PERPENDICULAR THIN FILMS; SINGULAR-POINT DETECTION; TRANSVERSE SUSCEPTIBILITY;

MAGNETIC MATERIALS;

EID: 0024738142     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.42573     Document Type: Article

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3. K.Le Dang, P.Veillet, G.Suran, K.Ounadjela. J. Appl. Phys, 62, 3328 (1987).
4. H.J.Lutke-Stetzkamp, R.W.Chantrell and S.Methfessel. J.de.Phys(in press).
5. E.C.Stoner, E.P.Wohlfarth. Proc.Roy.Soc., A240, 599 (1948)