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Volumn 36, Issue 9, 1989, Pages 1963-1967

A New Formula for Secondary Emission Yield

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; ELECTRON TUBES; MATHEMATICAL MODELS;

EID: 0024737077     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.34278     Document Type: Article
Times cited : (427)

References (9)
  • 1
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    • Carbon and carbon-coated electrodes for multi-stage depressed collectors for electron-beam tubes—A technology review
    • Nov.
    • A. N. Curren, “Carbon and carbon-coated electrodes for multi-stage depressed collectors for electron-beam tubes—A technology review,” IEEE Trans. Electron Devices, vol. ED-33, part II, pp. 1902–1914, Nov. 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 1902-1914
    • Curren, A.N.1
  • 2
    • 58749104650 scopus 로고
    • Secondary electron emission
    • L. Marton, Ed. New York: Academic
    • K. G. McKay, “Secondary electron emission,” in Advances in Electronics, vol. 1, L. Marton, Ed. New York: Academic, 1948.
    • (1948) Advances in Electronics , vol.1
    • McKay, K.G.1
  • 3
    • 11744331532 scopus 로고
    • An Introduction to Physical Electronics
    • New York: Elsevier
    • A. H. W. Beck and H. Ahmed, An Introduction to Physical Electronics, New York: Elsevier, 1968, p. 196.
    • (1968) , pp. 196
    • Beck, A.H.W.1    Ahmed, H.2
  • 4
    • 0043244743 scopus 로고
    • Theory of secondary emission
    • Aug. 11
    • R. G. Lye and A. J. Dekker, “Theory of secondary emission,” Phys. Rev., vol. 107, pp. 977–981, Aug. 11, 1957.
    • (1957) Phys. Rev. , vol.107 , pp. 977-981
    • Lye, R.G.1    Dekker, A.J.2
  • 5
    • 0019532092 scopus 로고
    • Dependence of secondary-electron emission from amorphous materials on primary angle of incidence
    • Feb.
    • M. Salehi and E. A. Flinn, “Dependence of secondary-electron emission from amorphous materials on primary angle of incidence,” J. Appl. Phys., vol. 52, pp. 994–996, Feb. 1981.
    • (1981) J. Appl. Phys. , vol.52 , pp. 994-996
    • Salehi, M.1    Flinn, E.A.2
  • 6
    • 85025798707 scopus 로고
    • The secondary electron emission coefficient of disordered surfaces
    • C. Bouchard and J. D. Carette, “The secondary electron emission coefficient of disordered surfaces,” Surface Sci., vol. 100, pp. 241–250, 1980.
    • (1980) Surface Sci. , vol.100 , pp. 241-250
    • Bouchard, C.1    Carette, J.D.2
  • 7
    • 0023325882 scopus 로고
    • Secondary electron emission characteristics of oxidized beryllium cathodes
    • V. H. Ritz, R. E. Thomas, J. W. Gibson, and J. Klebanoff, “Secondary electron emission characteristics of oxidized beryllium cathodes,” Surface Interface Anal., vol. 11, pp. 389–397, 1988.
    • (1988) Surface Interface Anal. , vol.11 , pp. 389-397
    • Ritz, V.H.1    Thomas, R.E.2    Gibson, J.W.3    Klebanoff, J.4
  • 8
    • 0039233161 scopus 로고
    • Comparative study of secondary-electron emission from positron and electron bombardment of Ni, Si and MgO
    • Dec. 1
    • R. Mayer and A. Weiss, “Comparative study of secondary-electron emission from positron and electron bombardment of Ni, Si and MgO,” Phys. Rev. B, vol. 38, pp. 11927–11930, Dec. 1, 1988.
    • (1988) Phys. Rev. B , vol.38 , pp. 11927-11930
    • Mayer, R.1    Weiss, A.2
  • 9
    • 84944293339 scopus 로고
    • Secondary electron emission of power tube materials
    • presented at the, Sept.
    • K. W. Dudley, “Secondary electron emission of power tube materials,” presented at the 7th Nat. Conf. on Tube Techniques, Sept. 1964.
    • (1964) 7th Nat. Conf. on Tube Techniques
    • Dudley, K.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.