Sensitivity analysis for simulations via likelihood ratios

Operations Research

Volumn 37, Issue 5, 1989, Pages 830-844

  Reiman, Martin I ^a   Weiss, Alan ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; PROBABILITY--RANDOM PROCESSES;

LIKELIHOOD RATIOS; POISSON RATES; REGENERATIVE SIMULATION;

MATHEMATICAL TECHNIQUES;

EID: 0024735795     PISSN: 0030364X     EISSN: None     Source Type: Journal    
DOI: 10.1287/opre.37.5.830     Document Type: Article

References (26)