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Volumn 28, Issue 8R, 1989, Pages 1426-1443

Silicon-on-insulator wafer bonding-wafer thinning technological evaluations

Author keywords

Polishing techniques; Silicon on lnsulator; Thinning by automatic stopper; Thinning without automatic stopper; Van der Waals bonding; Wafer bonding wafer thinning

Indexed keywords

SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0024717407     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.28.1426     Document Type: Article
Times cited : (80)

References (30)
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  • 19
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    • eds. H. R. Huff and R. R. Burgess (The Electrochemical Soc., Princeton NJ
    • J. B. Price: Semiconductor Silicon 1973, eds. H. R. Huff and R. R. Burgess (The Electrochemical Soc., Princeton NJ, 1973) pp. 339-353.
    • (1973) Semiconductor Silicon 1973 , pp. 339-353
    • Price, J.B.1
  • 20
    • 84911827365 scopus 로고
    • eds. H. R. Huff and R. R. Burgess (The Electrochemical Soc., Princeton NJ
    • H. Muraoka, T. Okhashi and Y. Sumitomo: Semiconductor Silicon 1973, eds. H. R. Huff and R. R. Burgess (The Electrochemical Soc., Princeton NJ, 1973) pp. 327-338.
    • (1973) Semiconductor Silicon 1973 , pp. 327-338
    • Muraoka, H.1    Okhashi, T.2    Sumitomo, Y.3
  • 21
    • 84956326087 scopus 로고    scopus 로고
    • Private communication
    • J. v.d. Meerakker: Private communication.
    • Meerakker, J.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.