An XPS Investigation of the Interface between Thin Polymethylmethacrylate (PMMA) Films and Natively Oxidized Al

physica status solidi (a)

Volumn 114, Issue 2, 1989, Pages K175-K177

  Unger, W ^a   Possart, W ^a  

^a Saxonian Academy of Sciences   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTROSCOPIC ANALYSIS; SPECTROSCOPY, X-RAY--APPLICATIONS;

INTERFACES;

POLYMETHYL METHACRYLATE;

EID: 0024717078     PISSN: 00318965     EISSN: 1521396X     Source Type: Journal    
DOI: 10.1002/pssa.2211140252     Document Type: Article

References (5)