Briefs. Thermal Effects in p-Channel MOSFET's at Low Temperatures

IEEE Transactions on Electron Devices

Volumn 36, Issue 8, 1989, Pages 1542-1544

  Foty, Daniel ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW TEMPERATURE ENGINEERING;

CRYOGENIC ELECTRONICS; DRAIN CURRENT TRANSIENTS; LOW TEMPERATURE CMOS; N-CHANNEL DEVICES; P-CHANNEL MOSFET;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0024717010     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.30968     Document Type: Article

References (16)

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