Regularization: A stable and accurate method for generating depth profiles from angle‐dependent XPS data

Surface and Interface Analysis

Volumn 14, Issue 8, 1989, Pages 443-450

  Tyler, B J ^a   Castner, D G ^a   Ratner, B D ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS;

DEPTH PROFILES; REGULARIZATION METHOD; X-RAY ELECTION SPECTROSCOPY;

SPECTROSCOPY, ELECTRON;

EID: 0024716070     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.740140804     Document Type: Article

References (27)

1. Determination of Depth Profiles by Angular Dependent X-Ray Photoelectron Spectra
2. Deconvolution of concentration depth profiles from angle resolved x-ray photoelectron spectroscopy data
3. Numerical Applications of a Formalism for Geophysical Inverse Problems
4. Understanding Inverse Theory
5. Earth models obtained by Monte Carlo Inversion
6. On the Numerical Solution of Fredholm Integral Equations of the First Kind by the Inversion of the Linear System Produced by Quadrature
7. Estimating Solutions of First Kind Integral Equations with Nonnegative Constraints and Optimal Smoothing