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Volumn 280, Issue 2-3, 1989, Pages 517-528
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Scattered X-ray beam nondestructive testing
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Author keywords
[No Author keywords available]
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Indexed keywords
IMAGING TECHNIQUES;
NONDESTRUCTIVE EXAMINATION;
COM SCAN SYSTEM;
COMPTON SCATTERING;
DIFFRACTION CURVES;
X-RAY DIFFRACTION TOMOGRAPHY;
X-RAYS;
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EID: 0024715851
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(89)90964-9 Document Type: Article |
Times cited : (62)
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References (27)
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