Analysis of the Charge Pumping Technique and Its Application for the Evaluation of MOSFET Degradation

IEEE Transactions on Electron Devices

Volumn 36, Issue 7, 1989, Pages 1318-1335

  Heremans, Paul ^a   Witters, Johan ^a   Groeseneken, Guido ^a   Maes, Herman E ^a  

^a Interuniversity Microelectronics Center ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS--ANALYSIS;

CHARGE PUMPING TECHNIQUE; CHARGE TRAPPING; INTERFACE TRAPS; MOS TRANSISTORS; MOSFET DEGRADATION;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0024705114     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.30938     Document Type: Article

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