Charging, Long-term Stability, and TSD Measurements of SiO 2 Electrets

IEEE Transactions on Electrical Insulation

Volumn 24, Issue 3, 1989, Pages 439-442

  Gunther P ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS--ELECTRIC CHARGE; SEMICONDUCTING SILICON--COATINGS; SILICA--ELECTRIC PROPERTIES;

CHARGE DECAY; CHARGE STABILITY; CHARGE STORAGE; SILICON WAFERS;

ELECTRETS;

EID: 0024685761     PISSN: 00189367     EISSN: None     Source Type: Journal    
DOI: 10.1109/14.30886     Document Type: Article

References (13)

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