SIERRA: A 3-D Device Simulator for Reliability Modeling

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 8, Issue 5, 1989, Pages 516-527

  Chern, Jue Hsien ^a   Maeda, John T ^b   Arledge, Lawrence A ^a   Yang, Ping ^a  

^a TEXAS INSTRUMENTS   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER GRAPHICS--COLOR; INTEGRATED CIRCUITS, VLSI--COMPUTER AIDED DESIGN; MATHEMATICAL MODELS; MATHEMATICAL TECHNIQUES--DIFFERENTIAL EQUATIONS;

3D DEVICE SIMULATOR; ELECTRON/HOLE CONTINUITY EQUATIONS; LATCHUP SIMULATIONS; POISSON EQUATION; SOFTWARE PACKAGE SIERRA;

SEMICONDUCTOR DEVICES;

EID: 0024664413     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.24880     Document Type: Article

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