An estimate of error rates in integrated circuits at aircraft altitudes and at sea level

Nuclear Inst. and Methods in Physics Research, B

Volumn 40-41, Issue PART 2, 1989, Pages 1295-1299

  Dicello, J F ^a   Paciotti, M ^b   Schillaci, M E ^b  

^a CLARKSON UNIVERSITY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AIRCRAFT--ELECTRONIC EQUIPMENT; CHARGED PARTICLES; MATHEMATICAL TECHNIQUES--ERROR ANALYSIS;

MICRODOSIMETRIC SPECTRA; NEGATIVE MUONS;

INTEGRATED CIRCUITS;

EID: 0024648073     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(89)90643-5     Document Type: Article

References (18)

1. The Relative Efficiency of Soft-Error Induction in 4K Static RAMS by Muons and Pions
2. Meson Interactions in NMOS and CMOS Static RAMs
3. Microdosimetry: Measured Probabilities for Energy Deposited by Mesons in One-Micron Sites in Silicon
4. Microelectronics and microdosimetry
5. Low-Energy π Mesons in the Cosmic Radiation
6. Single Event Upsets in RAMs Induced by Protons at 4.2 GeV and Protons and Neutrons below 100 MeV
7. Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data
8. Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data
9. A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984
10. Cosmic-Ray-Induced Errors in MOS Devices
11. Calculation of Cosmic-Ray Induced Soft Upsets and Scaling in VLSI Devices
12. 10th Int Conf on Application of Accelerators in Research and Industry
13. A Study of Single Event Upsets in Static RAMS's