Determination of the Time-Dependence of ΩNBS Using the Quantized Hall Resistance

IEEE Transactions on Instrumentation and Measurement

Volumn 38, Issue 2, 1989, Pages 263-269

  Yu, Dingyi ^a,b   Van Degrift, Craig T ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS--RESISTANCE; HALL EFFECT; PROBABILITY;

OHM; QUANTIZED HALL RESISTANCE; STANDARD DEVIATION;

UNITS OF MEASUREMENT;

EID: 0024647930     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.192285     Document Type: Article

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