Measurement of Microwave Permittivity Using a Six-Port Reflectometer with an Open-Ended Coaxial Line

IEEE Transactions on Instrumentation and Measurement

Volumn 38, Issue 2, 1989, Pages 505-508

  Ghannouchi, Fadhel M ^a   Bosisio, Renato G ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; REFLECTOMETERS;

COAXIAL TRANSMISSION LINES; SCATTERING PARAMETERS;

MICROWAVE MEASUREMENTS;

EID: 0024647547     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.192335     Document Type: Article

References (16)

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