Integration of Algorithmic VLSI Synthesis with Testability Incorporation

IEEE Journal of Solid-State Circuits

Volumn 24, Issue 2, 1989, Pages 409-416

  Gebotys, Catherine H ^a   Elmasry, Mohamed I ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; ELECTRIC FILTERS; INTEGRATED CIRCUIT TESTING;

ALGORITHMIC VLSI SYNTHESIS; BINARY-TREE DATA STRUCTURE; DELAY CONSTRAINTS; ELLIPTICAL WAVE FILTER; TESTABILITY;

INTEGRATED CIRCUITS, VLSI;

EID: 0024647420     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.18602     Document Type: Article

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