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Volumn 171, Issue 1, 1989, Pages 5-31

Stress-related effects in thin films

Author keywords

[No Author keywords available]

Indexed keywords

METALS AND ALLOYS--THIN FILMS; SPUTTERING; STRESSES--THERMAL;

EID: 0024641687     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(89)90030-8     Document Type: Article
Times cited : (1025)

References (41)
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    • Hoffman1
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    • A model of deadherence due to stresses in an elastic film
    • (1972) J. Phys. D , vol.5 , pp. 359
    • Hunt1    Gale2
  • 11
    • 0014801695 scopus 로고
    • Stress relief and hillock formation in thin lead films
    • (1970) J. Appl. Phys. , vol.41 , pp. 3172
    • Lahiri1
  • 14
    • 0015396665 scopus 로고
    • Recent developments in the study of mechanical properties of thin films
    • (1972) Thin Solid Films , vol.12 , pp. 17
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  • 15
    • 0001536019 scopus 로고
    • Stresses in thin films: the relevance of grain boundaries and impurities
    • (1976) Thin Solid Films , vol.34 , pp. 185
    • Hoffman1
  • 22
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    • The compressive stress transition in Al, V, Zr, Nb, and W metal films sputtered at low working pressures
    • (1977) Thin Solid Films , vol.45 , pp. 387
    • Hoffman1    Thornton2
  • 27
    • 0014598944 scopus 로고
    • Some measurements of stress in thin films prepared by low pressure triode sputtering
    • (1969) Vacuum , vol.19 , pp. 507
    • Stuart1
  • 29
    • 0008459859 scopus 로고
    • Reflection of noble gas ions at solid surfaces
    • (1961) Phys. Rev. , vol.123 , pp. 758
    • Hagstrum1
  • 32
    • 0016496746 scopus 로고
    • Argon entrapment in metal films by dc triode sputtering
    • (1975) J. Appl. Phys. , vol.46 , pp. 1728
    • Lee1    Oblas2
  • 33
    • 36849111254 scopus 로고
    • Scattering of low-energy noble gas ions from metal surfaces
    • (1967) J. Appl. Phys. , vol.38 , pp. 340
    • Smith1
  • 36
  • 37
    • 51249190770 scopus 로고
    • Stress and resistivity control in sputtered molybdenum films and comparison with sputtered gold
    • (1971) Metall. Trans. , vol.2 , pp. 699
    • Blachman1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.