Large-area fault clusters and fault tolerance in VLSI circuits: A review

IBM Journal of Research and Development

Volumn 33, Issue 2, 1989, Pages 162-173

  Stapper, Charles H ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL STATISTICS--APPLICATIONS; REDUNDANCY;

CLUSTER PARAMETER DEPENDENCIES; FAULT TOLERANCE; LARGE-AREA FAULT CLUSTERS; STATISTICAL MODELS;

INTEGRATED CIRCUITS, VLSI;

EID: 0024629198     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.332.0162     Document Type: Article

References (53)