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Volumn 25, Issue 2, 1989, Pages 783-788

A 4k josephson memory

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DEVICES--GATES; SUPERCONDUCTING DEVICES--JOSEPHSON JUNCTIONS;

EID: 0024627831     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.92404     Document Type: Article
Times cited : (42)

References (17)
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  • 3
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  • 4
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    • T. Igarashi, H. Suzuki, S. Hasuo, and T. Yamaoka, “A decoder with OR gates for a Josephson high-density memory circuit”, IEEE J. Solid-State Circuits, vol. sc-22, pp. 85–91, Feb. 1987.
    • (1987) IEEE J. Solid-State Circuits , vol.sc-22 , pp. 85-91
    • Igarashi, T.1    Suzuki, H.2    Hasuo, S.3    Yamaoka, T.4
  • 5
    • 0023291880 scopus 로고
    • A diagonal address generator for a Josephson memory circuit
    • Feb.
    • H. Suzuki and S. Hasuo, “A diagonal address generator for a Josephson memory circuit”, IEEE J. Solid-State Circuits, vol. sc-22, pp. 92–97, Feb. 1987.
    • (1987) IEEE J. Solid-State Circuits , vol.sc-22 , pp. 92-97
    • Suzuki, H.1    Hasuo, S.2
  • 6
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    • Suzuki, H.1    Hasuo, S.2
  • 8
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    • (1987) IEEE Solid-State Circuits , vol.sc-22 , pp. 892-898
    • Wada, Y.1    Nagasawa, S.2    Ishida, I.3
  • 9
    • 0021482437 scopus 로고
    • Josephson NOR decoder circuit for Josephson memory arrays
    • T. Nakanishi and S. Fujita, “Josephson NOR decoder circuit for Josephson memory arrays”, Japan. J. Appl. Phys., vol. 23, no.8, pp.1002-1006, 1984.
    • (1984) Japan. J. Appl. Phys. , vol.23 , Issue.8 , pp. 1002-1006
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  • 10
    • 0019246768 scopus 로고
    • Current injection logic gate with four Josephson junctions
    • Tokyo, Japan 1979; also Japan, J. Appl. Phys. Suppl. 19–1
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    • (1980) Proc. 11th Conf. Solid State Devices , vol.19 , pp. 607-611
    • Takada, S.1    Kosaka, S.2    Hayakawa, H.3
  • 11
    • 0022683237 scopus 로고
    • Ultrahigh-speed logic gate family with Nb/Al-AlOx/Nb Josephson junctions
    • Mar.
    • S. Kotani, N. Fujimaki, T. Imamura, and S. Hasuo, “Ultrahigh-speed logic gate family with Nb/Al-AlO x /Nb Josephson junctions”, IEEE Trans. Electron-Devices, vol. ED-33, pp.379-384, Mar. 1986.
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  • 12
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    • H. Ko, D. A. Petersen, and T. Van Duzer, “High-speed measurements of single gates; higher-voltage gates”, IEEE Trans. Mag., vol. MAG-23, pp.751-754, Mar. 1987.
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  • 13
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  • 14
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    • Thin film of niobium for cryotron ground planes
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.