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Volumn 77, Issue 3, 1989, Pages 389-407

Radiation Effects in GaAs FET Devices

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, DIGITAL; NEUTRONS; PROTONS; SEMICONDUCTING GALLIUM ARSENIDE--RADIATION EFFECTS;

EID: 0024627172     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/5.24126     Document Type: Article
Times cited : (28)

References (71)
  • 1
    • 84927471090 scopus 로고
    • R.K. Willardson and A.C. Beer, Eds. New York, NY: Academic Press, ch. 4.
    • L.W. Aukerman, Semiconductors and Semimetals, vol. 4, R.K. Willardson and A.C. Beer, Eds. New York, NY: Academic Press, 1968, ch. 4.
    • (1968) Semiconductors and Semimetals , vol.4
    • Aukerman, L.W.1
  • 2
    • 0017701799 scopus 로고
    • Radiation effects in enhancement mode GaAs JFETs
    • Dec.
    • R. Zuleeg, J.K. Notthoff, and K. Lehovec, “Radiation effects in enhancement mode GaAs JFETs,” IEEE Trans. Nuclear Sci., vol. NS-24, pp. 2305–2308, Dec. 1977.
    • (1977) IEEE Trans. Nuclear Sci. , vol.24 NS , pp. 2305-2308
    • Zuleeg, R.1    Notthoff, J.K.2    Lehovec, K.3
  • 3
    • 84937349455 scopus 로고
    • I-V and C-V characteristics of ion-implanted enhancement mode CaAs JFETs
    • K. Lehovec and R. Zuleeg, “I-V and C-V characteristics of ion-implanted enhancement mode CaAs JFETs,” Inst. Phys. Conf. Ser., vol. 33, pp. 263–282, 1977.
    • (1977) Inst. Phys. Conf. Ser. , vol.33 , pp. 263-282
    • Lehovec, K.1    Zuleeg, R.2
  • 4
    • 84941443938 scopus 로고
    • A 4K x 1 bit complementary E-JFET static RAM
    • Oct.
    • J.K. Notthoff et al., “A 4K x 1 bit complementary E-JFET static RAM,” in GaAs IC Symp. Tech. Digest, pp. 21–23, Oct. 1987.
    • (1987) GaAs IC Symp. Tech. Digest , pp. 21-23
    • Notthoff, J.K.1
  • 6
    • 84941474536 scopus 로고
    • Soft threshold of GaAs field-effect transistors
    • ch. 9
    • K. Lehovec and R. Zuleeg, “Soft threshold of GaAs field-effect transistors,” Inst. Phys. Conf. Ser., vol. 63, ch. 9, pp. 419–432, 1981.
    • (1981) Inst. Phys. Conf. Ser. , vol.63 , pp. 419-432
    • Lehovec, K.1    Zuleeg, R.2
  • 7
    • 1542585358 scopus 로고
    • Effects of total dose ionizing radiation on GaAs JFETs and ICs
    • paper 14
    • R. Zuleeg, K. Lehovec, and J.K. Notthoff, “Effects of total dose ionizing radiation on GaAs JFETs and ICs,” in GaAs IC Symp. Digest, paper 14, 1981.
    • (1981) GaAs IC Symp. Digest
    • Zuleeg, R.1    Lehovec, K.2    Notthoff, J.K.3
  • 8
    • 0020878820 scopus 로고
    • Logic upset level of GaAs SRAMs for pulsed ionizing radiation
    • Dec.
    • J.K. Notthoff, R. Zuleeg, and C.L. Troeger, “Logic upset level of GaAs SRAMs for pulsed ionizing radiation,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4173–4177, Dec. 1983.
    • (1983) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4173-4177
    • Notthoff, J.K.1    Zuleeg, R.2    Troeger, C.L.3
  • 9
    • 0019589231 scopus 로고
    • Pulsed ionizing radiation recovery characteristics of MSI GaAs integrated circuits
    • July
    • S.I. Long, F.S. Lee, and P. Pellegrini, “Pulsed ionizing radiation recovery characteristics of MSI GaAs integrated circuits,” IEEE Electron Device Lett., vol. EDL-2, pp. 173–176, July 1981.
    • (1981) IEEE Electron Device Lett. , vol.2 EDL , pp. 173-176
    • Long, S.I.1    Lee, F.S.2    Pellegrini, P.3
  • 10
    • 0019706625 scopus 로고
    • Total dose hardness of microwave GaAs field-effect transistor
    • Dec.
    • D.M. Newell et al., “Total dose hardness of microwave GaAs field-effect transistor,” lEEETrans. Nuclear Sci., vol. NS-28, pp. 4403–4410, Dec. 1981.
    • (1981) lEEETrans. Nuclear Sci. , vol.28 NS , pp. 4403-4410
    • Newell, D.M.1
  • 11
    • 0020293375 scopus 로고
    • Effects of gamma ray irradiation on GaAs MMICs
    • Y. Kadowaki et al., “Effects of gamma ray irradiation on GaAs MMICs,” in GaAs IC Symp. Tech. Dig., pp. 83–85, 1982.
    • (1982) GaAs IC Symp. Tech. Dig. , pp. 83-85
    • Kadowaki, Y.1
  • 12
    • 84886916552 scopus 로고
    • Total dose effects of gamma ray on GaAs ICs
    • ch. 8
    • K. Aono et al., “Total dose effects of gamma ray on GaAs ICs,” in Inst. Phys. Conf. Ser., vol. 83, ch. 8, pp. 527–532, 1986.
    • (1986) Inst. Phys. Conf. Ser. , vol.83 , pp. 527-532
    • Aono, K.1
  • 13
    • 70350581098 scopus 로고
    • The transient response of transistors and diodes to ionizing radiation
    • Nov.
    • J.L. Wirth and S.C. Rogers, “The transient response of transistors and diodes to ionizing radiation,” IEEE Trans. Nuclear Sci., vol. NS-11, pp. 24–28, Nov. 1964.
    • (1964) IEEE Trans. Nuclear Sci. , vol.11 NS , pp. 24-28
    • Wirth, J.L.1    Rogers, S.C.2
  • 14
    • 0015771302 scopus 로고
    • Transient response of epitaxial GaAs JFET structures to ionizing radiation
    • Dec.
    • W.S. Ginell et al., “Transient response of epitaxial GaAs JFET structures to ionizing radiation,” lEEE Trans. Nuclear Sci., vol. NS-20, pp. 171–179, Dec. 1973.
    • (1973) lEEE Trans. Nuclear Sci. , vol.20 NS , pp. 171-179
    • Ginell, W.S.1
  • 15
    • 0020908468 scopus 로고
    • Channel and substrate currents in GaAs FETs due to ionizing radiation
    • Dec.
    • R. Zuleeg et al., “Channel and substrate currents in GaAs FETs due to ionizing radiation,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4151–4156, Dec. 1983.
    • (1983) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4151-4156
    • Zuleeg, R.1
  • 17
    • 0019070531 scopus 로고
    • Radiation effects in GaAs junction FETs
    • Aug.
    • R. Zuleeg and K. Lehovec, “Radiation effects in GaAs junction FETs,” lEEETrans. Nuclear Sci., vol. NS-27, pp. 1343–1354, Aug. 1980.
    • (1980) lEEETrans. Nuclear Sci. , vol.27 NS , pp. 1343-1354
    • Zuleeg, R.1    Lehovec, K.2
  • 19
    • 84938452000 scopus 로고
    • Ionizing radiation response of GaAs JFETs and DCFL circuits
    • Dec.
    • R. Zuleeg et al., “Ionizing radiation response of GaAs JFETs and DCFL circuits,” IEEE Trans. Nuclear Sci., vol. NS-29, pp. 1656–1661, Dec. 1982.
    • (1982) IEEE Trans. Nuclear Sci. , vol.29 NS , pp. 1656-1661
    • Zuleeg, R.1
  • 20
    • 0019635014 scopus 로고
    • Transient radiation study of GaAs MESFETs implanted in Cr-doped and undoped substrates
    • Nov.
    • M. Simons et al., “Transient radiation study of GaAs MESFETs implanted in Cr-doped and undoped substrates,” J. Appl. Phys., vol. 52, pp. 6630–6638, Nov. 1981.
    • (1981) J. Appl. Phys. , vol.52 , pp. 6630-6638
    • Simons, M.1
  • 21
    • 0020271827 scopus 로고
    • Reduction of long-term transient radiation response in ion implanted GaAs FETs
    • Dec.
    • W.T. Anderson ef al., “Reduction of long-term transient radiation response in ion implanted GaAs FETs,” IEEE Trans. Nuclear Sci., vol. NS-29, pp. 1533–1538, Dec. 1982.
    • (1982) IEEE Trans. Nuclear Sci. , vol.29 NS , pp. 1533-1538
    • Anderson, W.T.1
  • 22
    • 0020915903 scopus 로고
    • The effects of transient radiation on GaAs Schottky diode FET logic circuits
    • Dec.
    • E.R. Walton et al., “The effects of transient radiation on GaAs Schottky diode FET logic circuits,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4178–4182, Dec. 1983.
    • (1983) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4178-4182
    • Walton, E.R.1
  • 23
    • 0020311983 scopus 로고
    • latchup in GaAs ICs during ionizing radiation exposure
    • R. Zuleeg et al., “latchup in GaAs ICs during ionizing radiation exposure,” in GaAs ICSymp. Tech. Digest, pp. 123–126, 1982.
    • (1982) GaAs ICSymp. Tech. Digest , pp. 123-126
    • Zuleeg, R.1
  • 24
    • 84939747058 scopus 로고
    • Backgating in GaAs MESFETs
    • July
    • C. Kocot and C. Stolte, “Backgating in GaAs MESFETs,” IEEE Trans. Electron Devices, vol. ED-29, pp. 1059–1067, July 1982.
    • (1982) IEEE Trans. Electron Devices , vol.29 ED , pp. 1059-1067
    • Kocot, C.1    Stolte, C.2
  • 25
    • 0022866161 scopus 로고
    • A model of transient radiation effects in GaAs static RAM cells
    • Dec.
    • A.T. Brown et al., “A model of transient radiation effects in GaAs static RAM cells,” IEEE Trans. Nuclear Sci., vol. NS-33, pp. 1519–1523, Dec. 1986.
    • (1986) IEEE Trans. Nuclear Sci. , vol.33 NS , pp. 1519-1523
    • Brown, A.T.1
  • 26
    • 0020920841 scopus 로고
    • Single event upset measurements of GaAs E-JFET RAMs
    • Dec.
    • P. Shapiro et al., “Single event upset measurements of GaAs E-JFET RAMs,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4610–4612, Dec. 1983.
    • (1983) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4610-4612
    • Shapiro, P.1
  • 27
    • 0020886234 scopus 로고
    • Radiation effects in GaAs integrated circuits: A comparison with silicon
    • M. Simons, “Radiation effects in GaAs integrated circuits: A comparison with silicon,” in GaAs IC Symp. Tech. Digest, pp. 124–128, 1983.
    • (1983) GaAs IC Symp. Tech. Digest , pp. 124-128
    • Simons, M.1
  • 28
    • 0020311020 scopus 로고
    • Single event error immune CMOS RAM
    • Dec.
    • J.L. Andrews et al., “Single event error immune CMOS RAM,” IEEE Trans. Nuclear Sci., vol. NS-29, pp. 2040–2043, Dec. 1982.
    • (1982) IEEE Trans. Nuclear Sci. , vol.29 NS , pp. 2040-2043
    • Andrews, J.L.1
  • 29
    • 0020247202 scopus 로고
    • Error analysis and prevention of cosmic ion-induced soft errors in static CMOS RAMs
    • Dec.
    • S.E. Diehl et al., “Error analysis and prevention of cosmic ion-induced soft errors in static CMOS RAMs,” IEEE Trans. Nuclear Sci., vol. NS-29, pp. 2032–2039, Dec. 1982.
    • (1982) IEEE Trans. Nuclear Sci. , vol.29 NS , pp. 2032-2039
    • Diehl, S.E.1
  • 30
    • 0018331014 scopus 로고
    • Alpha-particle-induced soft errors in dynamic memories
    • T.C. May and M.H. Woods, “Alpha-particle-induced soft errors in dynamic memories,” IEEE Trans. Electron Devices, vol. ED-26,. pp. 2–9, 1979.
    • (1979) IEEE Trans. Electron Devices , vol.26 ED , pp. 2-9
    • May, T.C.1    Woods, M.H.2
  • 31
    • 84938010858 scopus 로고
    • Alpha particle-induced soft errors
    • Apr.
    • D.J. Redman et al., “Alpha particle-induced soft errors,” Military Electronics/Countermeasures, vol. 2, pp. 40–48, Apr. 1980.
    • (1980) Military Electronics/Countermeasures , vol.2 , pp. 40-48
    • Redman, D.J.1
  • 32
    • 84904466214 scopus 로고
    • Satellite anomalies from galactic cosmic rays
    • Dec.
    • D. Binder et al., “Satellite anomalies from galactic cosmic rays,” lEEE Trans. Nuclear Sci., vol. NS-22, pp. 2675–2680, Dec. 1975.
    • (1975) lEEE Trans. Nuclear Sci. , vol.22 NS , pp. 2675-2680
    • Binder, D.1
  • 33
    • 84937995134 scopus 로고
    • Cosmic ray induced errors in MOS devices
    • Dec.
    • J.C. Pickel and J.T. Blanford, “Cosmic ray induced errors in MOS devices,” IEEE Trans. Nuclear Sci., vol. NS-27, pp. 1006–1015, Dec. 1980.
    • (1980) IEEE Trans. Nuclear Sci. , vol.27 NS , pp. 1006-1015
    • Pickel, J.C.1    Blanford, J.T.2
  • 34
    • 0020091827 scopus 로고
    • Alpha-particle-induced field and enhanced collection of carriers
    • Feb.
    • C. Hu, “Alpha-particle-induced field and enhanced collection of carriers,” IEEE Electron Device Lett., vol. EDL-3, pp. 31–34, Feb. 1982.
    • (1982) IEEE Electron Device Lett. , vol.3 EDL , pp. 31-34
    • Hu, C.1
  • 35
    • 0020904492 scopus 로고
    • Measurements of alpha-particle-induced charge in GaAs
    • Dec.
    • J.R. Srour and M.A. Hopkins, “Measurements of alpha-particle-induced charge in GaAs,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4457–4463, Dec. 1983.
    • (1983) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4457-4463
    • Srour, J.R.1    Hopkins, M.A.2
  • 36
    • 0019551234 scopus 로고
    • A field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices
    • Apr.
    • S.M. Hsieh et al., “A field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices,” IEEE Electron Device Lett, vol. EDL-2, pp. 103–105, Apr. 1981.
    • (1981) IEEE Electron Device Lett , vol.2 EDL , pp. 103-105
    • Hsieh, S.M.1
  • 38
    • 0022738646 scopus 로고
    • Effects of a buried Player on alpha-particle immunity of MESFETs fabricated on semi-insulating GaAs substrates
    • June
    • Y. Unemoto et al., “Effects of a buried Player on alpha-particle immunity of MESFETs fabricated on semi-insulating GaAs substrates,” IEEE Electron Device Lett., vol. EDL-7, pp. 396–397, June 1986.
    • (1986) IEEE Electron Device Lett. , vol.7 EDL , pp. 396-397
    • Unemoto, Y.1
  • 39
    • 0020920841 scopus 로고
    • Single event upset measurements of GaAs E-JFET RAMs
    • Dec.
    • P. Shapiro et al., “Single event upset measurements of GaAs E-JFET RAMs,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4610–4612, Dec. 1968.
    • (1968) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4610-4612
    • Shapiro, P.1
  • 40
    • 84941465067 scopus 로고
    • (vol. 3 of;. Radiation Effects Research and Technology).
    • R. Zuleeg et al., in HEART Conf. 1984 (vol. 3 of;. Radiation Effects Research and Technology).
    • (1984) HEART Conf.
    • Zuleeg, R.1
  • 41
  • 42
    • 0020880252 scopus 로고
    • Comparison and analytical models and experimental results for single event upset in CMOS SRAMs
    • Dec.
    • T.M. Mnich et al., “Comparison and analytical models and experimental results for single event upset in CMOS SRAMs,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4620–4623, Dec. 1983.
    • (1983) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4620-4623
    • Mnich, T.M.1
  • 43
  • 44
    • 0021586531 scopus 로고
    • SEU of complementary CaAs static RAMs due to heavy ions
    • Dec.
    • R. Zuleeg, J.K. Notthoff, and D.K. Nichols, “SEU of complementary CaAs static RAMs due to heavy ions,” IEEE Trans. Nuclear Sci., vol. NS-31, pp. 1121–1123, Dec. 1984.
    • (1984) IEEE Trans. Nuclear Sci. , vol.31 NS , pp. 1121-1123
    • Zuleeg, R.1    Notthoff, J.K.2    Nichols, D.K.3
  • 45
    • 0020948470 scopus 로고
    • Suggested single event upset figure of merit
    • Dec.
    • E.L. Petersen et al., “Suggested single event upset figure of merit,” IEEE Trans. Nuclear Sci., vol. NS-30, pp. 4533–4539, Dec. 1983.
    • (1983) IEEE Trans. Nuclear Sci. , vol.30 NS , pp. 4533-4539
    • Petersen, E.L.1
  • 46
    • 84939013559 scopus 로고
    • A study of single events in CaAs RAMs
    • Dec.
    • T.R. Weatherford et al., “A study of single events in CaAs RAMs,” IEEE Trans. Nuclear Sci., vol. NS-32, pp. 4170–4175, Dec. 1985.
    • (1985) IEEE Trans. Nuclear Sci. , vol.32 NS , pp. 4170-4175
    • Weatherford, T.R.1
  • 47
    • 84941440396 scopus 로고
    • presented at the 4th Annual Symp. on Single Event Effects, Los Angeles, CA, Apr.
    • R. Zuleeg and L.D. Flesner, presented at the 4th Annual Symp. on Single Event Effects, Los Angeles, CA, Apr. 1986.
    • (1986)
    • Zuleeg, R.1    Flesner, L.D.2
  • 48
    • 34447345345 scopus 로고
    • Gate charge collection and induced drain current in GaAs FETs
    • Dec.
    • L.D. Flesner, “Gate charge collection and induced drain current in GaAs FETs,” IEEE Trans. Nuclear Sci., vol. NS-32, pp. 4110–4114, Dec. 1985.
    • (1985) IEEE Trans. Nuclear Sci. , vol.32 NS , pp. 4110-4114
    • Flesner, L.D.1
  • 49
    • 84939047672 scopus 로고
    • Comparisons of single event vulnerability and GaAs SRAMs
    • Dec.
    • T.R. Weatherford, J.R. Hauser, andS.E. Diehl, “Comparisons of single event vulnerability and GaAs SRAMs,” IEEE Trans. Nuclear Sci., vol. NS-32, pp. 1590–1596, Dec. 1986.
    • (1986) IEEE Trans. Nuclear Sci. , vol.32 NS , pp. 1590-1596
    • Weatherford, T.R.1    Hauser, J.R.2    Diehl, S.E.3
  • 50
    • 0023145538 scopus 로고
    • RAM cell recovery mechanism following high-energy ion-strikes
    • Jan.
    • T. Weaver et al., “RAM cell recovery mechanism following high-energy ion-strikes,” IEEE Electron Device Lett., vol. EDL-8, pp. 7–9, Jan. 1987.
    • (1987) IEEE Electron Device Lett. , vol.8 EDL , pp. 7-9
    • Weaver, T.1
  • 52
    • 0038765976 scopus 로고
    • Electron radiation damage in unipolar transistor devices
    • Sept.
    • B.A. Kulp et al., “Electron radiation damage in unipolar transistor devices,” Proc. IRE, vol. 49, pp. 1437–1438, Sept. 1961.
    • (1961) Proc. IRE , vol.49 , pp. 1437-1438
    • Kulp, B.A.1
  • 53
    • 84938005615 scopus 로고
    • Epitaxial GaAs PN-junction FETs
    • R. Zuleeg, “Epitaxial GaAs PN-junction FETs,” Proc. IEEE, vol. 56, pp. 879–880, 1968.
    • (1968) Proc. IEEE , vol.56 , pp. 879-880
    • Zuleeg, R.1
  • 54
    • 84938160151 scopus 로고
    • Schottky barrier gate field-effect transistor
    • C.A. Mead, “Schottky barrier gate field-effect transistor,” Proc. IEEE, vol. 54, pp. 307–310, 1966.
    • (1966) Proc. IEEE , vol.54 , pp. 307-310
    • Mead, C.A.1
  • 55
    • 0038427265 scopus 로고
    • Predicted effects of neutron irradiation on GaAs JFETs
    • J.L. Nichols and W.S. Ginell, “Predicted effects of neutron irradiation on GaAs JFETs,” IEEE Trans. Nuclear Sci., vol. NS-17, pp. 52–61, 1970.
    • (1970) IEEE Trans. Nuclear Sci. , vol.17 NS , pp. 52-61
    • Nichols, J.L.1    Ginell, W.S.2
  • 56
    • 84937647369 scopus 로고
    • A unipolar field-effect transistor
    • Nov.
    • W. Shockley, “A unipolar field-effect transistor,” Proc. IRE, vol. 10, pp. 1365–1376, Nov. 1952.
    • (1952) Proc. IRE , vol.10 , pp. 1365-1376
    • Shockley, W.1
  • 57
    • 0346318941 scopus 로고
    • Fast neutron tolerance of GaAs JFETs operating in the hot electron range
    • A.F. Behle and R. Zuleeg, “Fast neutron tolerance of GaAs JFETs operating in the hot electron range,” IEEE Trans. Electron Devices, vol. ED-19, pp. 993–995, 1972.
    • (1972) IEEE Trans. Electron Devices , vol.19 ED , pp. 993-995
    • Behle, A.F.1    Zuleeg, R.2
  • 58
    • 1542480841 scopus 로고
    • Comparison of the neutron radiation tolerance of bipolar and junction field-effect transistors
    • Dec.
    • B. Buchanan et al., “Comparison of the neutron radiation tolerance of bipolar and junction field-effect transistors,” Proc. IEEE, vol. 55, pp. 2188–2197, Dec. 1967.
    • (1967) Proc. IEEE , vol.55 , pp. 2188-2197
    • Buchanan, B.1
  • 59
    • 0014863545 scopus 로고
    • Voltage-current characteristics of GaAs JFETs in the hot electron range
    • K. Lehovec and R. Zuleeg, “Voltage-current characteristics of GaAs JFETs in the hot electron range,” Solid-State Electron., vol. 13, pp. 1415–1426, 1970.
    • (1970) Solid-State Electron. , vol.13 , pp. 1415-1426
    • Lehovec, K.1    Zuleeg, R.2
  • 60
    • 84938014424 scopus 로고
    • Improved fast neutron tolerance of GaAs JFETs operating in the hot electron range
    • Dec.
    • J.L. McNichols and R. Zuleeg, “Improved fast neutron tolerance of GaAs JFETs operating in the hot electron range,” IEEE Trans. Nuclear Sci., vol. NS-18, pp. 110–113, Dec. 1971.
    • (1971) IEEE Trans. Nuclear Sci. , vol.18 NS , pp. 110-113
    • McNichols, J.L.1    Zuleeg, R.2
  • 61
    • 0017982098 scopus 로고
    • Femto-joule, high speed planar GaAs E-JFET logic
    • R. Zuleeg, J.K. Notthoff, and K. Lehovec, “Femto-joule, high speed planar GaAs E-JFET logic,” IEEE Trans. Electron Devices, vol. ED-25, pp. 628–639, 1978.
    • (1978) IEEE Trans. Electron Devices , vol.25 ED , pp. 628-639
    • Zuleeg, R.1    Notthoff, J.K.2    Lehovec, K.3
  • 62
    • 0016118160 scopus 로고
    • Highspeed integrated logic with GaAs MESFETs
    • Oct.
    • R.L. van Tuyl and C.H. Liechti, “Highspeed integrated logic with GaAs MESFETs,” IEEE J. Solid-State Circuits, vol. SC-9, pp. 269–276, Oct. 1974.
    • (1974) IEEE J. Solid-State Circuits , vol.9 SC , pp. 269-276
    • van Tuyl, R.L.1    Liechti, C.H.2
  • 63
    • 84937999449 scopus 로고
    • GaAs integrated circuits: MSI status and VLSI prospects
    • R.C. Eden, “GaAs integrated circuits: MSI status and VLSI prospects,” in IEDM Technical Digest, pp. 6–11, 1978.
    • (1978) IEDM Technical Digest , pp. 6-11
    • Eden, R.C.1
  • 64
    • 0018109297 scopus 로고
    • Neutron degradation of ion implanted and uniformly doped enhancement mode GaAs JFETs
    • R. Zuleeg and K. Lehovec, “Neutron degradation of ion implanted and uniformly doped enhancement mode GaAs JFETs,” IEEE Trans. Nuclear Sci., vol. NS-25, pp. 1444–1449, 1978.
    • (1978) IEEE Trans. Nuclear Sci. , vol.25 NS , pp. 1444-1449
    • Zuleeg, R.1    Lehovec, K.2
  • 65
    • 0019045924 scopus 로고
    • Degradation of GaAs MESFET in radiation environment
    • R.J. Gutman and J.M. Borrego, “Degradation of GaAs MESFET in radiation environment,” IEEE Trans. Reliability, vol. R-29, pp. 232–240, 1980.
    • (1980) IEEE Trans. Reliability , vol.29 R , pp. 232-240
    • Gutman, R.J.1    Borrego, J.M.2
  • 66
    • 0001713004 scopus 로고
    • Neutron radiation effects in GaAs ion implanted MESFETs
    • B.K. Janousek et al., “Neutron radiation effects in GaAs ion implanted MESFETs,” J. Appl. Phys., vol. 63, pp. 1678–1686, 1988.
    • (1988) J. Appl. Phys. , vol.63 , pp. 1678-1686
    • Janousek, B.K.1
  • 67
    • 0023312917 scopus 로고
    • Submicrometer GaAs MESFET with shallow channel and very high transconductance
    • Mar.
    • B.J. van Zeghbroeck et al., “Submicrometer GaAs MESFET with shallow channel and very high transconductance,” IEEE Electron Device Lett, vol. EDL-8, pp. 118–120, Mar. 1987.
    • (1987) IEEE Electron Device Lett , vol.8 EDL , pp. 118-120
    • van Zeghbroeck, B.J.1
  • 68
    • 0018584899 scopus 로고
    • Radiation effects on signal and noise characteristics of GaAs MESFET microwave amplifiers
    • Dec.
    • J.M. Borrego et al., “Radiation effects on signal and noise characteristics of GaAs MESFET microwave amplifiers,” IEEE Trans. Nuclear Sci., vol. NS-26, pp. 5092–5099, Dec. 1979.
    • (1979) IEEE Trans. Nuclear Sci. , vol.26 NS , pp. 5092-5099
    • Borrego, J.M.1
  • 69
    • 0002007506 scopus 로고
    • Progress in digital integrated electronics
    • G.E. Moore, “Progress in digital integrated electronics,” in IEDM Tech. Digest, pp. 11–13, 1975.
    • (1975) IEDM Tech. Digest , pp. 11-13
    • Moore, G.E.1
  • 70
    • 0021594159 scopus 로고
    • VLSI process architecture
    • Dec.
    • J.L. Hennessy, “VLSI process architecture,” lEEE Trans. Corn-put, vol. C-33, pp. 1221–1223, Dec. 1984.
    • (1984) lEEE Trans. Corn-put , vol.33 C , pp. 1221-1223
    • Hennessy, J.L.1
  • 71
    • 0022794963 scopus 로고
    • A 32-bit RISC implemented in enhancement mode JFET GaAs
    • Oct.
    • T.L. Rasset et al., “A 32-bit RISC implemented in enhancement mode JFET GaAs,” in IEEE Custom ICs Conf. Proc, Computers, vol. 19, pp. 60–68, Oct. 1986.
    • (1986) IEEE Custom ICs Conf. Proc, Computers , vol.19 , pp. 60-68
    • Rasset, T.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.