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Volumn 24, Issue 1, 1989, Pages 139-145

A Process-Parameter-Based Circuit Simulation Model for Ion-Implanted MOSFETs and MESFETs

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS--EQUIVALENT CIRCUITS; SUBSTRATES--DOPING; TRANSISTORS, FIELD EFFECT;

EID: 0024612265     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.16313     Document Type: Article
Times cited : (10)

References (9)
  • 1
    • 84916447709 scopus 로고
    • The correct equivalent box representation for the buried layer of BC MOSFET's in terms of the implantation parameters.
    • Oct.
    • S. Karmalkar and K. N. Bhat, “The correct equivalent box representation for the buried layer of BC MOSFET's in terms of the implantation parameters.” IEEE Electron Device Lett., vol. EDL-8, pp. 457-459, Oct. 1987.
    • (1987) IEEE Electron Device Lett. , vol.EDL-8 , pp. 457-459
    • Karmalkar, S.1    Bhat, K.N.2
  • 2
    • 84941485422 scopus 로고    scopus 로고
    • A simple C-V method to extract the correct equivalent box and Gaussian representations of the channel doping profile and the flat-band voltage in BC MOSFET's
    • to be published in Solid-State Electron.
    • S. Karmalkar and K. N. Bhat, “A simple C-V method to extract the correct equivalent box and Gaussian representations of the channel doping profile and the flat-band voltage in BC MOSFET's,” to be published in Solid-State Electron.
    • Karmalkar, S.1    Bhat, K.N.2
  • 3
    • 0022024793 scopus 로고
    • Online extraction of model parameters of a long buried-channel MOSFET
    • Mar.
    • A. B. Bhattacharya et al., “Online extraction of model parameters of a long buried-channel MOSFET,” IEEE Trans. Electron Devices, vol. ED-32, pp. 545-550, Mar. 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 545-550
    • Bhattacharya, A.B.1
  • 4
    • 0017981171 scopus 로고
    • Graded channel FETs: Improved linearity and noise figure
    • June
    • R. E. Williams and D. W. Shaw, “Graded channel FETs: Improved linearity and noise figure,” IEEE Trans. Electron Devices, vol. ED-25, pp. 600-605, June 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 600-605
    • Williams, R.E.1    Shaw, D.W.2
  • 6
    • 0021860202 scopus 로고
    • Analytical models of ion-implanted GaAs FET's
    • Jan.
    • T.-H. Chen and M. S. Shur, “Analytical models of ion-implanted GaAs FET's,” IEEE Trans. Electron Devices, vol. ED-32, pp. 18-27, Jan. 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 18-27
    • Chen, T.H.1    Shur, M.S.2
  • 7
    • 0018445193 scopus 로고
    • A device model for an ion-implanted MESFET
    • Mar.
    • G. W. Taylor et al., “A device model for an ion-implanted MESFET,” IEEE Trans. Electron Devices, vol. ED-26, pp. 172-182, Mar. 1979.
    • (1979) IEEE Trans. Electron Devices , vol.ED-26 , pp. 172-182
    • Taylor, G.W.1
  • 8
    • 0022751678 scopus 로고
    • Model for the channel-implanted enhancement mode IGFET
    • July
    • D. M. Rogers et al., “Model for the channel-implanted enhancement mode IGFET,” IEEE Trans. Electron Devices, vol. ED-33, pp. 955-964, July 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 955-964
    • Rogers, D.M.1
  • 9
    • 0022118809 scopus 로고
    • A simple punchthrough voltage model for short-channel MOSFET's with single channel implantation
    • Sept.
    • C. Y. Wu et al., “A simple punchthrough voltage model for short-channel MOSFET's with single channel implantation,” IEEE Trans. Electron Devices, vol. ED-32, pp. 1704-1707, Sept. 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 1704-1707
    • Wu, C.Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.