Metastability Behavior of CMOS ASIC FlipFlops in Theory and Test

IEEE Journal of Solid-State Circuits

Volumn 24, Issue 1, 1989, Pages 146-157

  Horstmann, Jens U ^a   Eichel, Hans W ^a   Coates, Robert L ^a  

^a AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS, SWITCHING--ANALYSIS; INTEGRATED CIRCUITS; LOGIC CIRCUITS;

CIRCUIT METASTABILITY; CMOS ASIC FLIP-FLOPS; SYNCHRONIZER FLIP FLOPS;

ELECTRONIC CIRCUITS, FLIP FLOP;

EID: 0024612173     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.16314     Document Type: Article

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