메뉴 건너뛰기




Volumn 36, Issue 2, 1989, Pages 453-456

Distributive Nature of Gate Current and Negative Transconductance in Heterostructure Field-Effect Transistors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS--EQUIVALENT CIRCUITS; SEMICONDUCTOR DIODES--MATHEMATICAL MODELS;

EID: 0024612020     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.19951     Document Type: Article
Times cited : (22)

References (8)
  • 3
    • 79952002427 scopus 로고
    • New mechanism of gate current in heterostructure insulated gate field-effect transistors
    • J. H. Baek, M. Shur, R. R. Daniels, D. K. Arch, J. K. Abrokwah, and O. N. Tufte, “New mechanism of gate current in heterostructure insulated gate field-effect transistors,” IEEE Electron Device Lett., vol. EDL-7, pp. 519–521, 1986.
    • (1986) IEEE Electron Device Lett , vol.EDL-7 , pp. 519-521
    • Baek, J.H.1    Shur, M.2    Daniels, R.R.3    Arch, D.K.4    Abrokwah, J.K.5    Tufte, O.N.6
  • 8
    • 84939365864 scopus 로고    scopus 로고
    • submitted for publication.
    • J. H. Baek and M. Shur, submitted for publication.
    • Baek, J.H.1    Shur, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.