Radiation damage in scientific charge-coupled devices

IEEE Transactions on Nuclear Science

Volumn 36, Issue 1, 1989, Pages 572-578

  Janesick, James ^a   Elliott, Tom ^a   Pool, Fred ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAYS; IONIZATION; PHOTONS; SEMICONDUCTOR DEVICES, CHARGE COUPLED;

CLUSTER DEFECT DAMAGE; DISPLACEMENT DAMAGE;

SCINTILLATION COUNTERS;

EID: 0024611260     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.34503     Document Type: Article

References (14)

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