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Volumn 8, Issue 1, 1989, Pages 56-63

On Path Selection in Combinational Logic Circuits

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, DIGITAL; LOGIC DESIGN; MATHEMATICAL TECHNIQUES--GRAPH THEORY;

EID: 0024480710     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.21819     Document Type: Article
Times cited : (109)

References (15)
  • 1
    • 0022307908 scopus 로고
    • Model for delay faults based upon paths
    • Nov.
    • G.L. Smith, “Model for delay faults based upon paths,” in Proc. 1985 Int. Text Conf., pp. 342–349, Nov. 1985.
    • (1985) Proc. 1985 Int. Text Conf. , pp. 342-349
    • Smith, G.L.1
  • 2
    • 0020926509 scopus 로고
    • Testing for timing faults in synchronous sequential integrated circuits
    • Oct.
    • Y.K. Malaiya and R. Narayanaswamy, “Testing for timing faults in synchronous sequential integrated circuits,” in Proc. 1983 Int'l. Test Conf, pp. 560–571, Oct. 1983.
    • (1983) Proc. 1983 Int'l. Test Conf , pp. 560-571
    • Malaiya, Y.K.1    Narayanaswamy, R.2
  • 4
    • 0022880990 scopus 로고
    • Random pattern testability of delay faults
    • Sept.
    • J. Savir and W.H. Mcanney, “Random pattern testability of delay faults,” Proc. 1986 Int. Test Conf, pp. 263–273, Sept. 1986.
    • (1986) Proc. 1986 Int. Test Conf , pp. 263-273
    • Savir, J.1    Mcanney, W.H.2
  • 5
  • 6
    • 0002609165 scopus 로고
    • Neutral netlist of ten combinational benchmark circuits and a target translator in FORTRAN
    • June
    • F. Brglez and H. Fujiwara, “Neutral netlist of ten combinational benchmark circuits and a target translator in FORTRAN,” Proc. IEEE Int. Symp. Circuits and Systems, June 1985.
    • (1985) Proc. IEEE Int. Symp. Circuits and Systems
    • Brglez, F.1    Fujiwara, H.2
  • 8
    • 84989495069 scopus 로고
    • Timing verification and the timing analysis program
    • June
    • R.B. Hitchcock, Sr., “Timing verification and the timing analysis program,” in Proc. ACM IEEE I9th Design Automation Conf, pp. 594–604, June 1982.
    • (1982) Proc. ACM IEEE I9th Design Automation Conf , pp. 594-604
    • Hitchcock, R.B.1
  • 9
    • 84989466311 scopus 로고
    • Synchronous path analysis in MOS circuit simulator
    • June
    • V.D. Agrawal, “Synchronous path analysis in MOS circuit simulator,” in Proc. ACM IEEE 19th Design Automation Conf, pp. 629635, June 1982.
    • (1982) Proc. ACM IEEE 19th Design Automation Conf , pp. 629-635
    • Agrawal, V.D.1
  • 10
    • 84941437587 scopus 로고
    • Path-delay computation algorithms for VLSI systems
    • Feb.
    • M.H. Al-Hussein, “Path-delay computation algorithms for VLSI systems,” VLSI design, pp. 86–91, Feb. 1985.
    • (1985) VLSI design , pp. 86-91
    • Al-Hussein, M.H.1
  • 12
    • 84941479830 scopus 로고
    • A delay test generation system for combinational logic
    • of Elect. Comp. Eng., Univ. of Wisconsin-Madison, Aug.
    • H.T. Liu and C.R. Kime, “A delay test generation system for combinational logic,” Tech. Rep. Dept, of Elect. Comp. Eng., Univ. of Wisconsin-Madison, Aug. 1987.
    • (1987) Tech. Rep. Dept
    • Liu, H.T.1    Kime, C.R.2
  • 13
    • 0019896149 scopus 로고
    • Timing analysis of computer hardware
    • Jan.
    • R.B. Hitchcock, G.L. Smith, and D.D. Cheng, “Timing analysis of computer hardware,” IBM J. Res. Develop., vol. 26, no. 1, pp. 100–108, Jan. 1982.
    • (1982) IBM J. Res. Develop. , vol.26 , Issue.1 , pp. 100-108
    • Hitchcock, R.B.1    Smith, G.L.2    Cheng, D.D.3
  • 14
    • 0023568919 scopus 로고
    • An automatic test pattern generator for the detection of path delay faults
    • Nov.
    • S.M. Reddy, C.J. Liu, and S. Patel, “An automatic test pattern generator for the detection of path delay faults,” in Proc. Int. Conf. on Computer Aided Design, pp. 284–287, Nov. 1987.
    • (1987) Proc. Int. Conf. on Computer Aided Design , pp. 284-287
    • Reddy, S.M.1    Liu, C.J.2    Patel, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.