Edge Detection and Linear Feature Extraction Using a 2-D Random Field Model

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 11, Issue 1, 1989, Pages 84-95

  Zhou, Y T ^a   Venkateswar, V ^a   Chellappa, R ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS;

AUTOREGRESSIVE MODELS; EDGE DETECTION; FEATURE EXTRACTION; RECURSIVE LEAST SQUARES ALGORITHM; TWO DIMENSIONAL RANDOM FIELD MODEL;

IMAGE PROCESSING;

EID: 0024479378     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.23115     Document Type: Article

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