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Volumn 37, Issue 1, 1989, Pages 203-219
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Direct observation of dislocation emission from crack tips in silicon at high temperatures
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS--DISLOCATIONS;
METALLOGRAPHY--LATTICE DEFECTS;
BRITTLE TO DUCTILE FRACTURE;
DISLOCATION EMISSION;
LATTICE FRICTION STRESS;
RICE-THOMSON ENERGY ANALYSIS;
SILICON AND ALLOYS;
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EID: 0024479144
PISSN: 00016160
EISSN: None
Source Type: Journal
DOI: 10.1016/0001-6160(89)90279-4 Document Type: Article |
Times cited : (123)
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References (33)
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