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Volumn , Issue , 1989, Pages 160-166
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Integrated reliability growth testing
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC EQUIPMENT--MILITARY APPLICATIONS;
SYSTEMS ENGINEERING--TESTING;
AMSAA MODEL;
INTEGRATED TESTING;
RELIABILITY GROWTH CURVES;
RELIABILITY GROWTH TESTING;
RELIABILITY;
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EID: 0024478830
PISSN: 0149144X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (25)
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References (9)
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