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Volumn 35, Issue 6, 1988, Pages 1634-1637
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A Comparison of Neutron-Induced SEU Rates in Si and GaAs Devices
a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
DATABASE SYSTEMS;
NEUTRONS;
PROTONS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING SILICON;
NUCLEAR RECOILS;
SINGLE EVENT UPSETS;
SEMICONDUCTOR DEVICES;
ARSENIC;
GALLIUM;
SILICON;
ARTICLE;
COMPARATIVE STUDY;
COSMIC RADIATION;
ENERGY TRANSFER;
EQUIPMENT DESIGN;
INSTRUMENTATION;
NASA DISCIPLINE NUMBER 22-70;
NASA DISCIPLINE RADIATION HEALTH;
NASA PROGRAM BIOMEDICAL RESEARCH;
NEUTRON;
NON-NASA CENTER;
RADIATION EXPOSURE;
SPACE FLIGHT;
NASA DISCIPLINE NUMBER 22-70;
NASA DISCIPLINE RADIATION HEALTH;
NASA PROGRAM BIOMEDICAL RESEARCH;
NON-NASA CENTER;
ARSENIC;
COSMIC RADIATION;
ENERGY TRANSFER;
EQUIPMENT DESIGN;
GALLIUM;
NEUTRONS;
SILICON;
SPACECRAFT;
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EID: 0024275221
PISSN: 00189499
EISSN: 15581578
Source Type: Journal
DOI: 10.1109/23.25511 Document Type: Article |
Times cited : (12)
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References (20)
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